Pattern recognition filters for digital images

ABSTRACT

In an exemplary embodiment, a pattern is recognized from digitized images. A first image metric is computed from a first digitized image and a second image metric is computed from a second digitized image. A composite image metric is computed as a function of the first image metric and the second image metric, and a pattern is identified by comparing the composite image metric against a reference image metric. The function may be a simple average or a weighted average. The image metric may include a separation distance between features, or a measured area of a feature, or a central angle between two arcs joining a feature to two other features, or an area of a polygon whose vertices are defined by features, or a second moment of a polygon whose vertices are defined by features. The images may include without limitation images of friction ridges, irises, or stars.

STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT

An embodiment was made with Government support under Contract No.WITHHELD. The Government has certain rights.

BACKGROUND

Pattern recognition is a method of identification based on recognizingpatterns of features in digital images. For example, iris recognitionuses an image of the irises of an individual's eyes to identify a personand fingerprint recognition uses an image of friction ridge skinimpressions to identify a person. As another example, a spacecraftidentifies its orientation in space through recognition of star trackerimages of star patterns. Obtaining a desired orientation in spacepermits a communication satellite to maintain a solar array pointed atthe sun for electrical power generation and communication antennaspointed at the earth for radiofrequency communications.

Problems that may be encountered in pattern recognition includeambiguity, false patterns, misidentification, and complexity due tomeasurement errors and field-of-view limitations. As an example,friction ridge distortion in a fingerprint due to excessive pressing canintroduce false patterns. Also, smudges in a fingerprint can introducemeasurement errors. As another example, changes in pupil size due tochanges in light can introduce false patterns in an iris. Measurementerrors can occur in iris measurement if a person to be identified doesnot hold still and/or look directly into a video camera.

As a further example, a star pattern may be ambiguous if it lies withinthe measurement error radius of multiple valid star patterns. Ambiguitycan also arise when no single star image contains enough stars to forman unambiguous pattern. False identification (aka “False Positives”) mayarise when non-stellar objects (such as proton flashes, dust particles,satellites, asteroids, or comets) and stars form a pattern which lieswithin the measurement error radius of a valid star pattern. In thesecases the algorithm may mistakenly believe it has correctly recognized areference pattern. Misidentification (aka “False Negatives”) occurs whenstar measurement errors exceed the value assumed by the star patternrecognition algorithm, thereby causing a star pattern to be outside themeasurement error radius assumed by the algorithm. In these cases thealgorithm may mistakenly believe that no reference pattern is in theimage. Complexity arises when the required number of features forpattern identification is increased (typically causing a polynomial orfactorial increase in required memory or computation usage).

Ambiguity, false identification and misidentification can be reduced byreducing the measurement error radius of patterns through reduced starposition measurement errors. Star position measurement errors can bereduced by combining data from multiple star images and then averagingthe combined data. Ambiguity due to too few stars can be reduced byincreasing the effective field of view to include more stars. Combiningdata from multiple offset star images can increase the effective fieldof view.

The foregoing examples of related art and limitations associatedtherewith are intended to be illustrative and not exclusive. Otherlimitations of the related art will become apparent to those of skill inthe art upon a reading of the specification and a study of the drawings.

SUMMARY

The following embodiments and aspects thereof are described andillustrated in conjunction with systems and methods which are meant tobe exemplary and illustrative, not limiting in scope. In variousembodiments, one or more of the problems described above in theBackground have been reduced or eliminated, while other embodiments aredirected to other improvements.

In an exemplary embodiment, a pattern is recognized from digitizedimages. A first image metric is computed from a first digitized imageand a second image metric is computed from a second digitized image. Acomposite image metric is computed as a function of the first imagemetric and the second image metric, and a pattern is identified bycomparing the composite image metric against a reference image metric.

According to an aspect, the function may be a simple average or aweighted average.

According to another aspect, the image metric may include a separationdistance between features, or a measured area of a feature, or a centralangle between two arcs joining a feature to two other features, or anarea of a polygon whose vertices are defined by features, or a secondmoment of a polygon whose vertices are defined by features.

According to a further aspect, the images may include without limitationimages of friction ridges, irises, or stars.

According to another exemplary embodiment, a star tracker orientation inspace is identified. A first star pattern metric is computed from afirst star tracker image, and a second star pattern metric is computedfrom a second star tracker image. A composite star pattern metric iscomputed as a function of the first star pattern metric and the secondstar pattern metric, and matching star patterns are identified bycomparing the composite star pattern metric against reference starpattern metrics computed from a star catalogue. Orientation of a startracker is identified from orientation of the matching star patterns.

In addition to the exemplary embodiments and aspects described above,further embodiments and aspects will become apparent by reference to thedrawings and by study of the following detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

Exemplary embodiments are illustrated in referenced figures of thedrawings. It is intended that the embodiments and figures disclosedherein are to be considered illustrative rather than restrictive.

FIG. 1 is a flowchart of an exemplary method of recognizing a patternfrom digitized images;

FIG. 2 illustrates features of an exemplary fingerprint from a frame ofan image;

FIG. 3 illustrates features of an exemplary iris from a frame of animage;

FIGS. 4A and 4B illustrate features of an exemplary star pattern from aframe of a star tracker image;

FIG. 5 illustrates multiple frames of images;

FIG. 6 is a block diagram of an exemplary system for executing themethod of FIG. 1;

FIG. 7 is a flow chart of an exemplary method of identifying a startracker orientation in space;

FIG. 8 is a block diagram of an exemplary spacecraft;

FIG. 9 is a block diagram of an exemplary system for executing themethod of FIG. 7; and

FIG. 10 is a block diagram of another exemplary system for executing themethod of FIG. 7.

DETAILED DESCRIPTION

Given by way of overview, in an exemplary embodiment a pattern isrecognized from digitized images. A first image metric is computed froma first digitized image and a second image metric is computed from asecond digitized image. A composite image metric is computed as afunction of the first image metric and the second image metric, and apattern is identified by comparing the composite image metric against areference image metric. The function may be a simple average or aweighted average. The image metric may include a separation distancebetween features, or a measured area of a feature, or a central anglebetween two arcs joining a feature to two other features, or an area ofa polygon whose vertices are defined by features, or a second moment ofa polygon whose vertices are defined by features. Details will bediscussed below.

Referring now to FIG. 1, an exemplary method 10 for recognizing apattern from digitized images starts at a block 12. The images mayinclude without limitation images of friction ridges, irises, or stars.

For example, referring now to FIG. 2, a fingerprint 14 is an impressionof friction ridges 16 of all or any part of a finger (or a palm or atoe). A digital image of the fingerprint 14 may be made in anyacceptable manner, such as without limitation with a digital camera.Several images of the fingerprint 14 may be taken, such as at a scene ofan investigation, thereby providing several frames of digital images.

The friction ridges 16 are raised portions of the epidermis on thepalmar or plantar skin, consisting of one or more connected ridge unitsof friction ridge skin. One of the ridges 16A includes minutiae that areimage features that represent points of interest in the fingerprint 14.Given by way of non-limiting example, the ridge 16A includes a shortridge 18 that terminates at a ridge ending 20 and bifurcates into ridges22 and 24. The ridges 22 and 24 reunite at a ridge ending 26, therebyforming a ridge enclosure 28 having an area A_(encl). Image featuremetrics that may be used to numerically measure features of the frictionridges 16 include a separation distance between the ridge endings 20 and26 or the measured area A_(encl).

As another example and referring now to FIG. 3, an iris 30 surrounds apupil 32 of an eye 34. Digital images of the iris 30 typically are madewith a video camera, thereby providing several frames of digital images.

A sclera portion 36, which is the white portion of the eye 34, in turnsurrounds the iris 30. A pupillary boundary 38 separates the pupil 32from the iris 30. The pupillary boundary 38 is an important imagefeature that ensures that identical portions of the iris 30 are assignedidentical coordinates every time an image is analyzed, regardless of thedegree of pupillary dilation. An inner boundary of the iris 30, formingthe pupil 32, can be accurately determined by exploiting the fact thatthe boundary of the pupil 32 is substantially a circular edge. The pupil32 is generally dark while the iris 30 is lighter, with variedpigmentation. However, this relationship may sometimes be reversed, forexample in eyes with dark irises and some cloudiness of the internallens, or because of optically co-axial illumination (directly into theeye), in which case light is reflected back from the retina and outagain through the pupil. A further reason that the image of the pupil 32may be bright is because of specular reflections from the cornea (notshown).

As another example and referring now to FIGS. 4A and 4B, an exemplary,non-limiting star pattern 40 includes stars A, B, and C. A star D isalso included in an image of the star pattern 40. The dots shown inFIGS. 4A and 4B represent tips of unit vectors directed from the starsensor (not shown) to the stars A, B, C and D on the surface of a unitsphere. The stars A, B, and C may be considered vertices of a polygon(in this case, a triangle). This triangle may be considered to be aspherical triangle, such as that obtained by connecting the verticeswith great circle arcs on the surface of the unit sphere as shown inFIG. 4A, or a planar triangle, such as that obtained by connecting thevertices by straight line segments as shown in FIG. 4B.

The star pattern 40 is imaged by a star sensor, such as a star camera,star tracker, star mapper, fine guidance sensor, or the like. Starsensors typically take low resolution images (between around 0.25MPixel-1.0 MPixel) at rates between 1-10 images per second. Ameasurement device of the star sensor may be a charge coupled device(CCD), charge injection device (CID), or active pixel sensor (APS).Intensities are typically measured by generated photoelectrons,digitized into “counts”, and often expressed as “instrument magnitudes”.Star sensors typically measure intensities and two-dimensional locations(that is, coordinates) of star images. The star sensor's orientationwith respect to the stars is often determined from the intensities andcoordinates of the star images by pattern matching methods. Theprojected coordinates are typically reported as Cartesian coordinate(that is, horizontal and vertical) pairs (H,V). However, polarcoordinates and spiral mappings may be used, if desired.

Referring back to FIG. 1, at a block 42 image feature metrics arecomputed from a set of digitized images. Processing in the block 42results in computation of a composite image feature metric.

Referring additionally to FIG. 5, at a block 44 a metric of a feature inan image 46 _(A) is computed. The image 46 _(A) may be an image offriction ridges (see FIG. 2), an iris (see FIG. 3), or a star pattern(see FIGS. 4A and 4B). Image features and their metrics may be selectedand measured as described below.

For example, referring additionally to FIG. 2, image feature metricsthat may be used to numerically measure features of the friction ridges16 include a separation distance between the ridge endings 20 and 26.Also, the measured area A_(encl) may serve as an image feature metric.

As another example and referring now to FIGS. 1, 3, and 5, image featuremetrics that may be used to numerically measure features of the iris 30include measured brightness of the pupillary boundary 38. The pupillaryboundary 38 can be detected as an image feature that presents itself asan abrupt and sudden change in brightness when summed along a circlewhose radius is steadily increasing. This sudden change will be maximumif the circle has its center near the true center of the pupil 32, andwhen its radius matches the true radius of the pupil 32. Thus, findingthe pupil 32 can be formulated as an optimization process, in which aseries of “exploding circles” (steadily increasing radii) are positionedwith their center coordinates located at each one of a number of trialpoints on a grid. Such an optimization process is described in U.S. Pat.No. 5,291,560, the contents of which are hereby incorporated byreference. For each exploding circle, and for each value of its radius,the total image brightness is summed over a fixed number of points lyingon this circle. Using a constant number of points on each circle,typically 128, avoids an automatic increase in the summed brightnesssimply due to increasing circumference. The system searches for themaximum rate of change in this quantity as radius expands. For thecandidate circle that best describes the pupillary boundary 38, therewill be a sudden “spike” in the rate-of-change of luminance summedaround its perimeter, when its radius just matches that of the pupillaryboundary 38. This spike will be larger for a circle that shares thepupil's center coordinates and radius than for all other circles.

As a further example and referring now to FIGS. 1, 4A, 4B, and 5, moststar pattern matching methods use star pattern metrics which arefunctions of the locations and/or intensities of multiple stars. Thenon-limiting star pattern 40 illustrates some exemplary metrics. Anexemplary metric is separation between star pairs. For example, an arcAB represents a separation metric between a star pair AB. Manyseparation metrics may be used as desired for the separation betweenstar pairs. A numerical value used for the separation metric AB could beproportional to an angle θ (in radians) between the unit vectors to starA and star B. Further, the separation metric AB may be proportional tocosine(θ), sine(θ), 2 sine(θ/2), tangent(θ), (sine(θ))², (cosine(θ))²,or other suitable functions of θ.

Another exemplary star pattern metric is an included angle in startriplets. The included angle may be a spherical angle between greatcircle arcs or a planar angle between vectors. For example and referringto FIG. 4A, a spherical angle α represents an included angle metric ofan interior angle of the star triplet BAC; a spherical angle βrepresents an included angle metric of an interior angle of the startriplet ABC; and a spherical angle γ represents an included angle metricof an interior angle of the star triplet ACB. As a further example andreferring to FIG. 4B, a planar angle a represents an angle betweenvectors B-A and C-A; a planar angle b represents an angle betweenvectors A-B and B-C; and a planar angle c represents an angle betweenvectors A-C and C-B.

Numeric metrics will be discussed using the spherical angle α and theplanar angle a as non-limiting examples. For example, a number used foran interior angle metric could be proportional to the spherical angle α(FIG. 4A) between great circle arcs AB and AC or to the planar angle a(FIG. 4B) between vectors B-A and C-A. Similarly, the number could beproportional to cosine(α), cosine(a), sine(α), sine(a), 2 sine(α/2), 2sine(a/2), tangent(α), tangent(a), (sine(α))², (sine(a))², (cosine(α))²,or (cosine(a))².

Other properties (such as without limitation spherical area, sphericalsecond moment (such as the spherical polar moment), planar area, planarsecond moment (such as the planar polar moment), singular values, convexhull) of star polygons may be used for star pattern matching, asdesired. Other approaches, including neural network methods or geneticalgorithms, use “feature vectors” which are functions of the starseparation metrics and interior angle metrics of groups of stars.

Referring now to FIGS. 1-5, at a block 48 the metric that was computedfor the feature in the image 46 _(A) is computed for the same feature inan image 46 _(B). For example, the image 46 _(B) may be another image ofthe friction ridges 16 (FIG. 2) that may be taken at a scene of aninvestigation. As another example, the image 46 _(B) may be a laterframe from video images of the iris 30 (FIG. 3). As a further example,the image 46 _(B) may be a later frame from star sensor images of thestar pattern 40 (FIGS. 4A and 4B).

If desired, at the block 48 the metric that was computed for the featurein the image 46 _(A) may be computed for the same feature in additionalimages, such as an image 46 _(C). The metric for the feature may becomputed for as many additional images 46 _(N) as desired. The moreimages from which the metric is computed will yield more accuracy in acomposite metric. However, increased accuracy will be balanced againstincreases in processing power and capabilities (and attendant increasesin power consumption and weight).

At a block 50, a composite image feature metric is computed as afunction of the metrics of the feature from the images 46 _(A) and 46_(B) (and optionally any additional images 46 _(C) through 46 _(N), asdesired). The function suitably is a filter function. For example, thefilter may implement an average, such as a simple average or a weightedaverage. Additional filtering may be performed, if desired. For example,an outlier filter, such as a median filter, may be used to removeoutliers As another example, the filter may assess variance ofuncorrelated errors in the metric.

Thus, the metrics have already been computed in each image 46A and 46Bat the blocks 44 and 48 (and, if desired any additional images 46Cthrough 46N). It is at the block 50 that filtering is applied to themetrics (instead of computing metrics from filtered image features). Incombining metrics from different image frames, it will be appreciatedthat the same feature (such as the same iris, or friction ridge, or setof stars) is measured by the metric in the image frames being combined.For example, stars are typically matched up from one star tracker frame(image) to the next by checking for a star image whose position,magnitude, and/or (occasionally) shape is that predicted byextrapolation from prior frames. Stars that fail these consistencychecks are typically marked as “invalid” and not used. This checking canbe done in the star tracker itself, in flight computer processingsoftware, or both. In the presence of proton radiation, especiallyduring a solar storm, or when traversing a radiation belt, the number ofstar images that are corrupted by protons is high enough that suchconsistency measures are extremely useful.

In addition and if desired, at the block 50 metrics that are notavailable in any single image frame may be combined. For example, theproperties of a triangle formed by three stars can be assembled eventhough only two of the three stars were marked valid in any singleframe. Then the refined metrics are made available to subsequent starpattern recognition processing.

At a block 52, a pattern is identified. The composite metric computed atthe block 50 of the image feature is compared against a reference imagefeature metric in a suitable manner for the image feature beingidentified. For example, a composite metric for a feature of a frictionridge (as described above) may be compared in a known manner againstreference metrics for features of fingerprints within an IntegratedAutomated Fingerprint Identification System (IAFIS) database maintainedby the United States Federal Bureau of Investigation (FBI) or a US-VISITrepository maintained by the United States Department of HomelandSecurity. As another example, a composite metric for a feature of aniris (as described above) may be compared in a known manner (such asthat taught in U.S. Pat. No. 5,291,560, the contents of which are herebyincorporated by reference) against reference metrics for features ofirises, such as those that are maintained by the United Kingdom's IrisRecognition Immigration System (IRIS), the United Arab Emirates bordercontrol iris database, or the Netherlands iris recognition database forSchiphol Airport.

As a further example, star pattern recognition processing may be anyacceptable known star pattern recognition processing. However, it wouldbe desirable for the star pattern recognition processing to takeadvantage of metric measurement error assessment to determine if theidentified pattern meets the desired level of confidence. An exemplarystar pattern identification includes processing a list of tracked starsfrom a star tracker frame (image), including the measured magnitude,horizontal (H) and vertical (V) position of each star in the startracker field of view. Metrics of measured stars bright enough to be ina star catalog (such as: angular separation between each star pair;included angle between the great circle arcs from a central star to twoother stars; spherical angle subtended by the spherical triangle formedby three stars; measured area of a polygon formed by stars; measuredbrightness of a star; and the like) have been used to create a candidatelist of star pairs (j) from a precalculated list of star metrics. Thecandidate list is the list of catalog stars whose precalculated metricis the measured metric plus-or-minus the measured uncertainty.

Using star pair separation as a non-limiting example, for each star pair(j) on the candidate list, the star catalog is searched to see if anycatalog star separations match the measured star pair separations to theuncertainty in the measurement. If all the measured star positions passthis test, and the number of confirmed star pair measurements issufficiently high as to be unlikely to be attributable to chance, then apattern is considered to be identified.

After a pattern is identified at the block 52, processing of the method10 stops at a block 54.

Referring now to FIG. 6, an exemplary system 60 recognizes a patternfrom digitized images. To that end, the system 60 is well-suited forexecuting the method 10 (FIG. 1).

An input interface 62 receives the images 46 _(A), 46 _(B), and anyadditional images 46 _(C) through 46 _(N) (FIG. 5) (or data regardingthe images) from a source of the images. For example, the inputinterface 62 may receive images of the friction ridges 16 (FIG. 2),frames of video images of the iris 30 (FIG. 3), or star sensor images ofthe star pattern 40 (FIG. 5). The input interface 62 suitably is anyappropriate interface for a desired application. For example, the inputinterface 62 may include without limitation a serial interface, aparallel interface, a USB interface, or the like. Input interfaces areknown in the art, and a detailed discussion of their construction andoperation is not necessary for embodiments described herein.

A processor 64 processes information received from the input interface62. The processor 64 suitably is any computer processor or computerprocessors, or processing component or components, such as amicroprocessor, that is configured to perform filtering processes, suchas simple averaging, weighted averaging, median filtering, varianceassessment, pattern matching, and the like. As such, the processor 64executes processing of the blocks 42 (including the blocks 44, 48, and50) and 52 (all FIG. 1). Thus, the processor 64 is configured to computean image metric of an image feature from the image 46 _(A) and an imagemetric of the same image feature from the image 46 _(B) (and any otherimages 46 _(C) through 46 _(N)) (all FIG. 5). The processor 64 also isconfigured to compute a composite image metric as a function of thefeature metric from the image 46 _(A) and the feature metric from theimage 46 _(B) (and any other images 46 _(C) through 46 _(N)). Finally,the processor 64 is configured to identify a pattern by comparing thecomposite image metric against a reference image metric.

A pattern catalogue 66 is a repository or database of patterns of imagesmay represent a matching pattern. The pattern catalogue 66 resides in asuitable storage device that is accessible by the processor 64 in aknown manner. As discussed above, the pattern catalogue may be arepository of friction ridge images, iris images, or star patterns.

A pattern recognition database 68 is a listing of image feature metrics,such as metrics of friction ridge lines or friction ridge areas, orbrightnesses of papillary boundaries. In the context of star patterns,the pattern recognition database can include: identifications of pairsof stars (by star names or numbers) and a list of star separations;and/or identifications of star triplets and a list of angles definedthereby; and/or identifications of stars in polygons (such as triangles)and areas thereof. The pattern recognition database 68 resides in asuitable storage device that is accessible by the processor 64 in aknown manner.

Referring now to FIG. 7, an exemplary method 110 is provided foridentifying a star tracker orientation in space. The method 110 buildsupon processing of star patterns discussed above for the method 10 (FIG.1). To that end, the method 110 starts at a block 112. At a block 142,metrics of a feature of a star pattern, such as the star pattern 40(FIGS. 4A and 4B), are computed from a set of star tracker images 46_(A), 46 _(B), and, if desired, additional star tracker images 46 _(C)through 46 _(N) (FIG. 5). Processing at the block 142 results incomputation of a composite metric of the feature of the star pattern.

At a block 144, a metric of a feature of a star pattern in a startracker image 46 _(A) is computed. As discussed above, the star patternmetrics are functions of the locations and/or intensities of multiplestars. An exemplary metric is separation between star pairs. Given byway of non-limiting example and referring additionally to FIG. 5, anumerical value used for a separation metric AB could be proportional toan angle θ (in radians) between the unit vectors to star A and star B,cosine(θ), sine(θ), 2 sine(θ/2), tangent(θ), (sine(θ))², (cosine(θ))²,or another suitable function of θ.

As also discussed above, another exemplary star pattern metric is anincluded angle in star triplets. The included angle may be a sphericalangle between great circle arcs (see FIG. 4A) or a planar angle (seeFIG. 4B) between vectors. Given by way of non-limiting example, a numberused for an interior angle metric could be proportional to the sphericalangle α (FIG. 4A) between great circle arcs AB and AC or to the planarangle a (FIG. 4B) between vectors B-A and C-A. Similarly, the numbercould be proportional to cosine(α), cosine(a), sine(α), sine(a), 2sine(α/2), 2 sine(a/2), tangent(α), tangent(a), (sine(α))², (sine(a))²,(cosine(α))², or (cosine(a))². Further, and as discussed above,spherical area, spherical second moment (such as the spherical polarmoment), planar area, planar second moment (such as the planar polarmoment), singular values, convex hull of star polygons, and “featurevectors” may be used for star pattern matching, as desired.

At a block 148, the metric that was computed for the star patternfeature in the star tracker image 46 _(A) is computed for the samefeature in the star tracker image 46 _(B.) In this example, the startracker image 46 _(B) is a later frame from star sensor images of thestar pattern. If desired, at the block 148 the metric that was computedfor the star pattern feature in the star tracker image 46 _(A) may becomputed for the same star pattern feature in additional star trackerimages, such as the star tracker image 46 _(C). The metric for the starpattern feature may be computed for as many additional star trackerimages 46 _(N) as desired.

At a block 150, a composite metric of the feature of the star pattern iscomputed as a function of the metrics of the feature from the startracker images 46 _(A) and 46 _(B) (and optionally any additional startracker images 46 _(C) through 46 _(N), as desired). As discussed above,the function suitably is a filter function that may implement anaverage, such as a simple average or a weighted average. Additionalfiltering that may be performed implements an outlier filter, such as amedian filter, to remove outliers. Further, the filter may assessvariance of uncorrelated errors in the metric. Thus, the metrics havealready been computed in each star tracker image 46A and 46B at theblocks 144 and 148 (and, if desired any additional star tracker images46C through 46N), and it is at the block 150 that filtering is appliedto the metrics (instead of computing metrics from filtered star trackerimage features). As discussed above, if desired, at the block 150 starpattern metrics that are not available in any single star tracker imageframe may be combined. For example, the properties of a triangle formedby three stars can be assembled even though only two of the three starswere marked valid in any single frame. Then the refined metrics are madeavailable to subsequent star pattern recognition processing.

At a block 152, matching star patterns are identified. The compositemetric computed at the block 150 of the star pattern feature is comparedagainst reference star pattern metrics. As discussed above, star patternrecognition processing at the block 152 may be any acceptable known starpattern recognition processing, and it would be desirable for the starpattern recognition processing at the block 152 to take advantage ofmetric measurement error assessment to determine if the identifiedpattern meets the desired level of confidence. Exemplary star patternrecognition processing that may be performed at the block 152 has beendiscussed above for the block 52 of the method 10 (FIG. 1). In theinterest of brevity, these details need not be repeated.

At a block 153, star tracker orientation is identified from orientationof the matching star patterns. This is done using any acceptable knownstellar attitude determination means. Exemplary methods are described in“Geoscience Laser Altimeter System (GLAS) Algorithm Theoretical BasisDocument Version 2.2: Precision Attitude Determination (PAD)” by SungkooBae and Bob E. Schutz, Center for Space Research, The University ofTexas at Austin, October 2002, the contents of which are herebyincorporated by reference.

Referring now to FIG. 8 and given by way of non-limiting example, aspacecraft 160 provides an exemplary host environment in which themethod 110 (FIG. 7) can be executed. The spacecraft 160 can be any typeof spacecraft as desired. Given by way of non-limiting example, thespacecraft suitably may be a satellite, such as a communicationssatellite, navigation satellite, earth observation satellite, orscientific satellite, a launch vehicle, such as a submarine-launchedmissile, a manned spacecraft, or an interplanetary probe. The followingdescription of the spacecraft 160 is adapted from U.S. Pat. No.6,766,227, which is assigned to The Boeing Company, the assignee of thispatent application, and the contents of which are incorporated byreference

The spacecraft 160 has a body 162 that carries an exemplary servicesystem in the form, for example, of a communication system 164. Thecommunication system 164 provides services (e.g., communicationservices) to a service area on the earth with a transponder system 166that interfaces with antennas 168. This service can only be effected ifthe spacecraft is controlled to have a service attitude.

Accordingly, the body 162 also carries an attitude determination andcontrol system 170 which includes attitude-control processors 172, astar sensor system 174 that includes at least one star sensor 174A andmay include at least one other star sensor 174B, angular velocitysensors 176, other attitude sensors 230, and torque generators 178. Inresponse to attitude sense signals from the star sensor system 174 andthe angular velocity sensors 176, the attitude-control processors 172generate control signals 180.

In response to the control signals 180, the torque generators 178 inducetorques in the body 162 which cause it to assume a commanded attitude(e.g., the spacecraft's service attitude). Because their torques alterthe attitude of the body 162, the torque generators 178 effectivelygenerate a feedback path 182 that alters attitude sense signals of thestar sensor system 174 and the angular velocity sensors 176.

Attitude of the spacecraft 160 can be defined with reference to abody-centered coordinate system that comprises a roll axis 184, a pitchaxis 186, and a yaw axis 188 (directed towards the viewer). The systemsof the spacecraft 160 suitably are powered with electrical power that isgenerated, for example, by at least one solar panel 190.

Referring now to FIG. 9, in one exemplary embodiment theattitude-control processors 172 of the attitude determination andcontrol system 170 include a star data processor 192, at least one starcatalog 194, a stellar attitude acquisition system 196, a recursivefilter system 198, an attitude determination and controller 200, anattitude and rate command section 202, and an ephemeris determinationsystem 204.

The stellar attitude acquisition system 196 receives star sensor signals206 from the star sensor system 174 and accesses data from the starcatalogs 194 to thereby identify the stars that generated thestar-sensor signals 206. If this identification is successful, thestellar attitude acquisition system 196 provides an initial attitudeestimate 208 to the attitude determination and controller 200. Thus, inthis embodiment the stellar attitude acquisition block 196 performsprocessing of the block 142 (that is, the blocks 144, 148, and 150) andthe block 152 of the method 110 (all FIG. 7).

The star data processor 192 also receives star sensor signals 206 fromthe star sensor system 174 and has access to data from the star catalogs194. Once the attitude determination and controller 200 receives theinitial attitude estimate 208, the attitude determination and controller200 provides attitude updates 209 to the star data processor 192. Thestar data processor 192 generates star measurement signals 210 withoutrequiring star pattern matching. The star measurement signals 210 fromthe star data processor 192 are processed by the recursive filter system198 into subsequent attitude estimates 212 which are then provided tothe attitude determination and controller 200. The star data processor192 and the stellar attitude acquisition system 196 couple tracked-starcommands 214 to the star sensor system 174 to thereby control whichstars are tracked by the star sensors 174A and 174B.

With access to ephemeris data 204 (e.g., earth and sun locations), theattitude and rate command 202 provides a commanded attitude 216 to theattitude determination and controller 200 which also receives ratesignals 218 from the angular velocity sensors 176. In response, theattitude determination and controller 200 delivers torque commandsignals 220 to the torque generators 178 (e.g., thrusters 222, momentumwheels 224, and magnetic torquers 226). The resultant torque inducesrotation of the spacecraft body 162 (FIG. 8) which forms an effectivefeedback rotation signal 228 that is sensed by the star sensor system174, angular velocity sensors 176, and any other attitude sensors 230(e.g., sun sensor, earth sensor, magnetometer, beacon sensor) thatprovide other sense signals 232 to the attitude determination andcontroller 200.

It may be desirable to reduce memory requirements onboard the spacecraftbecause of the high costs of radiation-hardened memory. For example, atypical star pattern recognition database may entail on the order ofaround 60 Kbytes of storage and a typical star pattern catalogue mayentail on the order of around 100 Kbytes. It may also be desirable toperform some processing off board the spacecraft in order to reduceweight and power consumption.

To that end and referring now to FIG. 10, a system 260 provides anexemplary host environment off board a spacecraft 261 for hostingprocessing and storage entailed in executing the method 110 (FIG. 7).The spacecraft 261 can be any type of spacecraft as desired. The system260 can be hosted in any off board setting, such as in a ground stationor onboard a mobile platform such as an aircraft, a maritime vessel, orthe like.

Star pattern metrics are computed as described above for the startracker images 46 _(A) and 46 _(B) (and any additional star trackerimages 46 _(C) through 46 _(N)) (FIG. 5) and are transmitted viaradiofrequency signals by the spacecraft 261 to an antenna 263 that ispart of the system 260. Alternately, the star tracker images 46 _(A) and46 _(B) (and any additional star tracker images 46 _(C) through 46 _(N))(FIG. 5) may be transmitted by the spacecraft 261. A transceiver 265receives the radiofrequency signals from the antenna 263, demodulatesand/or decodes the radiofrequency signals, and provides baseband signalsto an input/output interface 262. The input/output interface 262provides suitably formatted signals to a processor 264. The processor264 executes processing of the block 150 (FIG. 7) to compute thecomposite star pattern metric. Alternately, the processor 264 executesprocessing of the block 142 (FIG. 7) to compute the individual metricsand the composite star pattern metric when signals of the images aretransmitted by the spacecraft 261. The processor 264 accesses starpatterns from a star pattern catalogue 266 and star pattern metrics froma pattern recognition database 268 to execute processing of the block152 to identify matching star patterns. The identified matching starpatterns are provided to the transceiver 265 via the input/outputinterface 262 and transmitted to the spacecraft 261 via the antenna 263.Further processing may be performed as discussed above in reference toFIGS. 8 and 9.

In various embodiments, portions of the system and method include acomputer program product. The computer program product includes acomputer-readable storage medium, such as the non-volatile storagemedium, and computer-readable program code portions, such as a series ofcomputer instructions, embodied in the computer-readable storage medium.Typically, the computer program is stored and executed by a processingunit or a related memory device, such as the processor 64 (FIG. 6), thestellar attitude acquisition 196 (FIG. 9), or the processor 264 (FIG.10).

In this regard, FIGS. 1 and 6-10 are block diagrams and flowcharts ofmethods, systems and program products according to various embodiments.It will be understood that each block of the block diagrams andflowcharts and combinations of blocks in the block diagrams andflowcharts can be implemented by computer program instructions. Thesecomputer program instructions may be loaded onto a computer or otherprogrammable apparatus to produce a machine, such that the instructionswhich execute on the computer or other programmable apparatus createmeans for implementing the functions specified in the block diagrams orflowchart blocks. These computer program instructions may also be storedin a computer-readable memory that can direct a computer or otherprogrammable apparatus to function in a particular manner, such that theinstructions stored in the computer-readable memory produce an articleof manufacture including instruction means which implement the functionspecified in the block diagrams or flowchart blocks. The computerprogram instructions may also be loaded onto a computer or otherprogrammable apparatus to cause a series of operational steps to beperformed on the computer or other programmable apparatus to produce acomputer-implemented process such that the instructions which execute onthe computer or other programmable apparatus provide steps forimplementing the functions specified in the block diagrams or flowchartblocks.

Accordingly, blocks of the block diagrams or flowcharts supportcombinations of means for performing the specified functions,combinations of steps for performing the specified functions and programinstruction means for performing the specified functions. It will alsobe understood that each block of the block diagrams or flowcharts, andcombinations of blocks in the block diagrams or flowcharts, can beimplemented by special purpose hardware-based computer systems whichperform the specified functions or steps, or combinations of specialpurpose hardware and computer instructions.

While a number of exemplary embodiments and aspects have beenillustrated and discussed above, those of skill in the art willrecognize certain modifications, permutations, additions, andsub-combinations thereof. It is therefore intended that the followingappended claims and claims hereafter introduced are interpreted toinclude all such modifications, permutations, additions, andsub-combinations as are within their true spirit and scope.

1. A method of recognizing a pattern from digitized images, the methodcomprising: computing a first image metric from a firstdigitally-captured image; computing a second image metric from a seconddigitally-captured image; computing a composite image metric as afunction of the first image metric and the second image metric; andidentifying, by a processor, a pattern by comparing the composite imagemetric against a reference image metric.
 2. The method of claim 1,wherein the function includes a simple average.
 3. The method of claim1, wherein the function includes a weighted average.
 4. The method ofclaim 1, wherein at least one of the first image metric and the secondimage metric includes a separation distance between a first feature anda second feature.
 5. The method of claim 1, wherein at least one of thefirst image metric and the second image metric includes a measured areaof a feature.
 6. The method of claim 1, wherein: a first arc joins afirst feature and a second feature; a second arc joins the first featureand a third feature; and at least one of the first image metric and thesecond image metric includes a central angle between the first arc andthe second arc.
 7. The method of claim 1, wherein: a first feature, asecond feature, and a third feature define vertices of a polygon; and atleast one of the first image metric and the second image metric includesan area of the polygon.
 8. The method of claim 7, wherein the polygonincludes a triangle.
 9. The method of claim 1, wherein: a first feature,a second feature, and a third feature define vertices of a polygon; andat least one of the first image metric and the second image metricincludes a second moment of the polygon.
 10. The method of claim 1,further comprising: computing a third image metric from a thirddigitally-captured image; and wherein the composite image metric iscomputed as a function of the first, second, and third image metrics.11. The method of claim 1, further comprising: identifying an outlierfeature with an outlier filter; and wherein the function ignores theidentified outlier feature.
 12. The method of claim 11, wherein theoutlier filter includes a median filter.
 13. The method of claim 1,wherein the first and second digitally-captured images include frictionridge images.
 14. The method of claim 1, wherein the first and seconddigitally-captured images include iris images.
 15. The method of claim1, wherein the first and second digitally-captured images include starpattern images.
 16. A method of identifying a star tracker orientationin space, the method comprising: computing a first star pattern metricfrom a first digitally-captured star tracker image; computing a secondstar pattern metric from a second digitally-captured star tracker image;computing a composite star pattern metric as a function of the firststar pattern metric and the second star pattern metric; identifyingmatching star patterns by comparing the composite star pattern metricagainst reference star pattern metrics computed from a star catalogue;and identifying, by a processor, orientation of a star tracker fromorientation of the matching star patterns.
 17. The method of claim 16,wherein the function includes a simple average.
 18. The method of claim16, wherein the function includes a weighted average.
 19. The method ofclaim 16, wherein at least one of the first star pattern metric and thesecond star pattern metric includes a separation distance between afirst star and a second star.
 20. The method of claim 16, wherein atleast one of the first star pattern metric and the second star patternmetric includes a measured brightness of a star.
 21. The method of claim16, wherein: a first arc joins a first star and a second star; a secondarc joins the first star and a third star; and at least one of the firststar pattern metric and the second star pattern metric includes acentral angle between the first arc and the second arc.
 22. The methodof claim 16, wherein: a first star, a second star, and a third stardefine vertices of a polygon; and at least one of the first star patternmetric and the second star pattern metric includes an area of thepolygon.
 23. The method of claim 22, wherein the polygon includes atriangle.
 24. The method of claim 16, wherein: a first star, a secondstar, and a third star define vertices of a polygon; and at least one ofthe first star pattern metric and the second star pattern metricincludes a second moment of the polygon.
 25. The method of claim 16,further comprising: computing a third star pattern metric from a thirddigitally-captured star tracker image; and wherein the composite starpattern metric is computed as a function of the first, second, and thirdstar pattern metrics.
 26. The method of claim 16, further comprising:identifying an outlier feature with an outlier filter; and wherein thefunction ignores the identified outlier feature.
 27. The method of claim26, wherein the outlier filter includes a median filter.
 28. A systemfor recognizing a pattern from digitized images, the system comprising:an input interface; and a processor operatively coupled to the inputinterface, the processor configured to: compute a first image metricfrom a first digitally-captured image; compute a second image metricfrom a second digitally-captured image; compute a composite image metricas a function of the first image metric and the second image metric; andidentify a pattern by comparing the composite image metric against areference image metric.
 29. The system of claim 28, further comprising:a pattern catalogue that includes a plurality of reference imagemetrics; and a pattern recognition database.
 30. The system of claim 28,wherein the function includes a simple average.
 31. The system of claim28, wherein the function includes a weighted average.
 32. The system ofclaim 28, wherein at least one of the first image metric and the secondimage metric includes a separation distance between a first feature anda second feature.
 33. The system of claim 28, wherein at least one ofthe first image metric and the second image metric includes a measuredarea of a feature.
 34. The system of claim 28, wherein: a first arcjoins a first feature and a second feature; a second arc joins the firstfeature and a third feature; and at least one of the first image metricand the second image metric includes a central angle between the firstarc and the second arc.
 35. The system of claim 28, wherein: a firstfeature, a second feature, and a third feature define vertices of apolygon; and at least one of the first image metric and the second imagemetric includes an area of the polygon.
 36. The system of claim 35,wherein the polygon includes a triangle.
 37. The system of claim 28,wherein: a first feature, a second feature, and a third feature definevertices of a polygon; and at least one of the first image metric andthe second image metric includes a second moment of the polygon.
 38. Thesystem of claim 28, wherein: the processor is further configured tocompute a third image metric from a third digitally-captured image; andwherein the composite image metric is computed as a function of thefirst, second, and third image metrics.
 39. The system of claim 28,further comprising an outlier filter executable by the processor, theoutlier filter configured to identify an outlier feature; and whereinthe function ignores the identified outlier feature.
 40. The system ofclaim 39, wherein the outlier filter includes a median filter.
 41. Thesystem of claim 28, wherein the first and second digitally-capturedimages include friction ridge images.
 42. The system of claim 28,wherein the first and second digitally-captured images include irisimages.
 43. The system of claim 28, wherein the first and seconddigitally-captured images include star pattern images.
 44. A system foridentifying a star tracker orientation in space, the system comprising:an input interface; and a processor operatively coupled to the inputinterface, the processor configured to: compute a first star patternmetric from a first digitally-captured star tracker image; compute asecond star pattern metric from a second digitally-captured star trackerimage; compute a composite star pattern metric as a function of thefirst star pattern metric and the second star pattern metric; identify amatching star pattern by comparing the composite star pattern metricagainst a reference star pattern metric; and identify orientation of astar tracker from orientation of the matching star pattern.
 45. Thesystem of claim 44, further comprising: a star pattern catalogue thatincludes a plurality of reference image metrics; and a star patternrecognition database.
 46. The system of claim 44, wherein the functionincludes a simple average.
 47. The system of claim 44, wherein thefunction includes a weighted average.
 48. The system of claim 44,wherein at least one of the first star pattern metric and the secondstar pattern metric includes a separation distance between a first starand a second star.
 49. The system of claim 44, wherein at least one ofthe first star pattern metric and the second star pattern metricincludes a measured brightness of a star.
 50. The system of claim 44,wherein: a first arc joins a first star and a second star; a second arcjoins the first star and a third star; and at least one of the firststar pattern metric and the second star pattern metric includes acentral angle between the first arc and the second arc.
 51. The systemof claim 44, wherein: a first star, a second star, and a third stardefine vertices of a polygon; and at least one of the first star patternmetric and the second star pattern metric includes an area of thepolygon.
 52. The system of claim 51, wherein the polygon includes atriangle.
 53. The system of claim 44, wherein: a first star, a secondstar, and a third star define vertices of a polygon; and at least one ofthe first star pattern metric and the second star pattern metricincludes a second moment of the polygon.
 54. The system of claim 44,wherein: the processor is further configured to compute a third starpattern metric from a third digitally-captured star tracker image; andwherein the composite star pattern metric is computed as a function ofthe first, second, and third star pattern metrics.
 55. The system ofclaim 44, further comprising: an outlier filter executable by theprocessor, the outlier filter configured to identify an outlier feature;and wherein the function ignores the identified outlier feature.
 56. Thesystem of claim 55, wherein the outlier filter includes a median filter.57. The system of claim 44, further comprising: a transceiveroperatively coupled to the input interface; and an antenna operativelycoupled to the transceiver, the antenna being configured to communicatevia radiofrequency communications with a spacecraft.
 58. Anon-transitory computer-readable memory device comprising instructionsthat, when executed by a processor, cause the processor to: compute afirst image metric from a first digitally-captured image; compute asecond image metric from a second digitally-captured image; compute acomposite image metric as a function of the first image metric and thesecond image metric; and identify a pattern by comparing the compositeimage metric against a reference image metric.
 59. The non-transitorycomputer-readable memory device of claim 58, wherein the functionincludes a simple average.
 60. The non-transitory computer-readablememory device of claim 58, wherein the function includes a weightedaverage.
 61. The non-transitory computer-readable memory device of claim58, wherein at least one of the first image metric and the second imagemetric includes a separation distance between a first feature and asecond feature.
 62. The non-transitory computer-readable memory deviceof claim 58, wherein at least one of the first image metric and thesecond image metric includes a measured area of a feature.
 63. Thenon-transitory computer-readable memory device of claim 58, wherein: afirst arc joins a first feature and a second feature; a second arc joinsthe first feature and a third feature; and at least one of the firstimage metric and the second image metric includes a central anglebetween the first arc and the second arc.
 64. The non-transitorycomputer-readable memory device of claim 58, wherein: a first feature, asecond feature, and a third feature define vertices of a polygon; and atleast one of the first image metric and the second image metric includesan area of the polygon.
 65. The non-transitory computer-readable memorydevice of claim 64, wherein the polygon includes a triangle.
 66. Thenon-transitory computer-readable memory device of claim 58, wherein: afirst feature, a second feature, and a third feature define vertices ofa polygon; and at least one of the first image metric and the secondimage metric includes a second moment of the polygon.
 67. Thenon-transitory computer-readable memory device of claim 58, furthercomprising: instructions that are executable by the processor to causethe processor to compute a third image metric from a thirddigitally-captured image; and wherein the composite image metric iscomputed as a function of the first, second, and third image metrics.68. The non-transitory computer-readable memory device of claim 58,further comprising: instructions that are executable by the processor tocause the processor to identify an outlier feature with an outlierfilter; and wherein the function ignores the identified outlier feature.69. The non-transitory computer-readable memory device of claim 68,wherein the outlier filter includes a median filter.
 70. Thenon-transitory computer-readable memory device of claim 58, wherein thefirst and second digitally-captured images include friction ridgeimages.
 71. The non-transitory computer-readable memory device of claim58, wherein the first and second digitally-captured images include irisimages.
 72. The non-transitory computer-readable memory device of claim58, wherein the first and second digitally-captured images include starpattern images.
 73. A non-transitory computer-readable memory devicecomprising instructions that, when executed by a processor, cause theprocessor to: compute a first star pattern metric from a firstdigitally-captured star tracker image; compute a second star patternmetric from a second digitally-captured star tracker image; compute acomposite star pattern metric as a function of the first star patternmetric and the second star pattern metric; identify matching starpatterns by comparing the composite star pattern metric againstreference star pattern metrics computed from a star catalogue; andidentify orientation of a star tracker from orientation of the matchingstar patterns.
 74. The non-transitory computer-readable memory device ofclaim 73, wherein the function includes a simple average.
 75. Thenon-transitory computer-readable memory device of claim 73, wherein thefunction includes a weighted average.
 76. The non-transitorycomputer-readable memory device of claim 73, wherein at least one of thefirst star pattern metric and the second star pattern metric includes aseparation distance between a first star and a second star.
 77. Thenon-transitory computer-readable memory device of claim 73, wherein atleast one of the first star pattern metric and the second star patternmetric includes a measured brightness of a star.
 78. The non-transitorycomputer-readable memory device of claim 73, wherein: a first arc joinsa first star and a second star; a second arc joins the first star and athird star; and at least one of the first star pattern metric and thesecond star pattern metric includes a central angle between the firstarc and the second arc.
 79. The non-transitory computer-readable memorydevice of claim 73, wherein: a first star, a second star, and a thirdstar define vertices of a polygon; and at least one of the first starpattern metric and the second star pattern metric includes an area ofthe polygon.
 80. The non-transitory computer-readable memory device ofclaim 79, wherein the polygon includes a triangle.
 81. Thenon-transitory computer-readable memory device of claim 73, wherein: afirst star, a second star, and a third star define vertices of apolygon; and at least one of the first star pattern metric and thesecond star pattern metric includes a second moment of the polygon. 82.The non-transitory computer-readable memory device of claim 73, furthercomprising: instructions that are executable by the processor to causethe processor to compute a third star pattern metric from a thirddigitally-captured star tracker image; and wherein the composite starpattern metric is computed as a function of the first, second, and thirdstar pattern metrics.
 83. The non-transitory computer-readable memorydevice of claim 73, further comprising: instructions that are executableby the processor to cause the processor to identify an outlier featurewith an outlier filter; and wherein the function ignores the identifiedoutlier feature.
 84. The non-transitory computer-readable memory deviceof claim 83, wherein the outlier filter includes a median filter.
 85. Aspacecraft comprising: a spacecraft body; at least one star tracker thatis coupled with a known spatial relationship to the spacecraft body; aprocessor operatively coupled to the star tracker, the processorconfigured to: compute a first star pattern metric from a firstdigitally-captured star tracker image; compute a second star patternmetric from a second digitally-captured star tracker image; compute acomposite star pattern metric as a function of the first star patternmetric and the second star pattern metric; identify a matching starpattern by comparing the composite star pattern metric against areference star pattern metric; and identify orientation of a startracker from orientation of the matching star pattern; and a torquegeneration system that is physically coupled to the spacecraft body andoperatively coupled to the processor, the torque generation systemconfigured to alter attitude of the spacecraft with generated torqueresponsive to orientation identified by the processor.
 86. Thespacecraft of claim 85, further comprising: a star pattern cataloguethat includes a plurality of reference image metrics; and a star patternrecognition database.
 87. The spacecraft of claim 85, wherein thefunction includes a simple average.
 88. The spacecraft of claim 85,wherein the function includes a weighted average.
 89. The spacecraft ofclaim 85, wherein at least one of the first star pattern metric and thesecond star pattern metric includes a separation distance between afirst star and a second star.
 90. The spacecraft of claim 85, wherein atleast one of the first star pattern metric and the second star patternmetric includes a measured brightness of a star.
 91. The spacecraft ofclaim 85, wherein: a first arc joins a first star and a second star; asecond arc joins the first star and a third star; and at least one ofthe first star pattern metric and the second star pattern metricincludes a central angle between the first arc and the second arc. 92.The spacecraft of claim 85, wherein: a first star, a second star, and athird star define vertices of a polygon; and at least one of the firststar pattern metric and the second star pattern metric includes an areaof the polygon.
 93. The spacecraft of claim 92, wherein the polygonincludes a triangle.
 94. The spacecraft of claim 85, wherein: a firststar, a second star, and a third star define vertices of a polygon; andat least one of the first star pattern metric and the second starpattern metric includes a second moment of the polygon.
 95. Thespacecraft of claim 85, wherein: the processor is further configured tocompute a third star pattern metric from a third digitally-captured startracker image; and wherein the composite star pattern metric is computedas a function of the first, second, and third star pattern metrics. 96.The spacecraft of claim 85, wherein: the processor further configured toimplement an outlier filter to identify an outlier feature; and thefunction ignores the identified outlier feature.
 97. The spacecraft ofclaim 96, wherein the outlier filter includes a median filter.
 98. Thespacecraft of claim 85, wherein the spacecraft includes a spacecraftchosen from a group including a satellite and a launch vehicle.